Test planning for modular testing of hierarchical SOCs

Krishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski. Test planning for modular testing of hierarchical SOCs. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(3):435-448, 2005. [doi]

Authors

Krishnendu Chakrabarty

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Vikram Iyengar

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Mark D. Krasniewski

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