Krishnendu Chakrabarty, Vikram Iyengar, Mark D. Krasniewski. Test planning for modular testing of hierarchical SOCs. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(3):435-448, 2005. [doi]
@article{ChakrabartyIK05,
title = {Test planning for modular testing of hierarchical SOCs},
author = {Krishnendu Chakrabarty and Vikram Iyengar and Mark D. Krasniewski},
year = {2005},
doi = {10.1109/TCAD.2004.842816},
url = {http://dx.doi.org/10.1109/TCAD.2004.842816},
tags = {testing},
researchr = {https://researchr.org/publication/ChakrabartyIK05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {24},
number = {3},
pages = {435-448},
}