Tapan J. Chakraborty, Vishwani D. Agrawal. Simulation of at-speed tests for stuck-at faults. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 216-220, IEEE Computer Society, 1995. [doi]
@inproceedings{ChakrabortyA95,
title = {Simulation of at-speed tests for stuck-at faults},
author = {Tapan J. Chakraborty and Vishwani D. Agrawal},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000216abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ChakrabortyA95},
cites = {0},
citedby = {0},
pages = {216-220},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}