Controlling NBTI degradation during static burn-in testing - researchr publication authors

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Ashutosh Chakraborty, David Z. Pan. Controlling NBTI degradation during static burn-in testing. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 597-602, IEEE, 2011. [doi]

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