Ashutosh Chakraborty, David Z. Pan. Controlling NBTI degradation during static burn-in testing. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 597-602, IEEE, 2011. [doi]
@inproceedings{ChakrabortyP11,
title = {Controlling NBTI degradation during static burn-in testing},
author = {Ashutosh Chakraborty and David Z. Pan},
year = {2011},
doi = {10.1109/ASPDAC.2011.5722259},
url = {http://dx.doi.org/10.1109/ASPDAC.2011.5722259},
tags = {testing},
researchr = {https://researchr.org/publication/ChakrabortyP11},
cites = {0},
citedby = {0},
pages = {597-602},
booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011},
publisher = {IEEE},
isbn = {978-1-4244-7516-2},
}