Srimat T. Chakradhar, Vijay Gangaram, Steven G. Rothweiler. Deriving Signal Constraints to Accelerate Sequential Test Generation. In 10th International Conference on VLSI Design (VLSI Design 1997), 4-7 January 1997, Hyderabad, India. pages 488-494, IEEE Computer Society, 1997. [doi]
Abstract is missing.