Krishna Chakravadhanula, Vivek Chickermane, Brion L. Keller, Patrick R. Gallagher Jr., Steven Gregor. Test Generation for State Retention Logic. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 237-242, IEEE Computer Society, 2008. [doi]
Abstract is missing.