Diagnostic simulation of stuck-at faults in combinational circuits

Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman. Diagnostic simulation of stuck-at faults in combinational circuits. J. Electronic Testing, 8(1):87-97, 1996. [doi]

Authors

Sreejit Chakravarty

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Yiming Gong

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Srikanth Venkataraman

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