Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman. Diagnostic simulation of stuck-at faults in combinational circuits. J. Electronic Testing, 8(1):87-97, 1996. [doi]
@article{ChakravartyGV96,
title = {Diagnostic simulation of stuck-at faults in combinational circuits},
author = {Sreejit Chakravarty and Yiming Gong and Srikanth Venkataraman},
year = {1996},
doi = {10.1007/BF00136078},
url = {http://dx.doi.org/10.1007/BF00136078},
tags = {diagnostics},
researchr = {https://researchr.org/publication/ChakravartyGV96},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {8},
number = {1},
pages = {87-97},
}