A Unified Framework for Defect Data Analysis Using the MBR Technique - researchr publication authors

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Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen. A Unified Framework for Defect Data Analysis Using the MBR Technique. In 18th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2006), 13-15 November 2006, Washington, DC, USA. pages 39-46, IEEE Computer Society, 2006. [doi]

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