Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen. A Unified Framework for Defect Data Analysis Using the MBR Technique. In 18th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2006), 13-15 November 2006, Washington, DC, USA. pages 39-46, IEEE Computer Society, 2006. [doi]
@inproceedings{ChallagullaBY06,
title = {A Unified Framework for Defect Data Analysis Using the MBR Technique},
author = {Venkata U. B. Challagulla and Farokh B. Bastani and I-Ling Yen},
year = {2006},
doi = {10.1109/ICTAI.2006.23},
url = {http://doi.ieeecomputersociety.org/10.1109/ICTAI.2006.23},
tags = {analysis, data-flow analysis},
researchr = {https://researchr.org/publication/ChallagullaBY06},
cites = {0},
citedby = {0},
pages = {39-46},
booktitle = {18th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2006), 13-15 November 2006, Washington, DC, USA},
publisher = {IEEE Computer Society},
}