Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen. A Unified Framework for Defect Data Analysis Using the MBR Technique. In 18th IEEE International Conference on Tools with Artificial Intelligence (ICTAI 2006), 13-15 November 2006, Washington, DC, USA. pages 39-46, IEEE Computer Society, 2006. [doi]
Abstract is missing.