Test of Data Retention Faults Sensing the Bit Line with a DFT Bases Differential Amplifier - researchr publication authors

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Víctor H. Champac, Victor Avendaño, Gordana Jovanovic-Dolecek. Test of Data Retention Faults Sensing the Bit Line with a DFT Bases Differential Amplifier. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 273-276, IEEE, 2001.

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