Víctor H. Champac, Victor Avendaño, Gordana Jovanovic-Dolecek. Test of Data Retention Faults Sensing the Bit Line with a DFT Bases Differential Amplifier. In 2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001. pages 273-276, IEEE, 2001.
@inproceedings{ChampacAJ01,
title = {Test of Data Retention Faults Sensing the Bit Line with a DFT Bases Differential Amplifier},
author = {Víctor H. Champac and Victor Avendaño and Gordana Jovanovic-Dolecek},
year = {2001},
researchr = {https://researchr.org/publication/ChampacAJ01},
cites = {0},
citedby = {0},
pages = {273-276},
booktitle = {2nd Latin American Test Workshop, LATW 2001, Cancun, Mexico, February 11-14, 2001},
publisher = {IEEE},
}