Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy. Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection. In Nicola Bombieri, Graziano Pravadelli, Masahiro Fujita, Todd M. Austin, Ricardo Reis, editors, VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms - 26th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018, Revised and Extended Selected Papers. Volume 561 of IFIP Advances in Information and Communication Technology, pages 207-231, Springer, 2018. [doi]
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