Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos. SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 177-182, IEEE, 2015. [doi]
@inproceedings{ChampeixBDRLS15-0,
title = {SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology},
author = {Clement Champeix and Nicolas Borrel and Jean-Max Dutertre and Bruno Robisson and Mathieu Lisart and Alexandre Sarafianos},
year = {2015},
doi = {10.1109/DFT.2015.7315158},
url = {http://dx.doi.org/10.1109/DFT.2015.7315158},
researchr = {https://researchr.org/publication/ChampeixBDRLS15-0},
cites = {0},
citedby = {0},
pages = {177-182},
booktitle = {2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8606-4},
}