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Benchmarking of Mask Fracturing Heuristics

Tuck Boon Chan, Puneet Gupta, Kwangsoo Han, Abde Ali Kagalwalla, Andrew B. Kahng. Benchmarking of Mask Fracturing Heuristics. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(1):170-183, 2017. [doi]

Authors

Tuck Boon Chan

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Puneet Gupta

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Kwangsoo Han

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Abde Ali Kagalwalla

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Andrew B. Kahng

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