Benchmarking of Mask Fracturing Heuristics

Tuck Boon Chan, Puneet Gupta, Kwangsoo Han, Abde Ali Kagalwalla, Andrew B. Kahng. Benchmarking of Mask Fracturing Heuristics. IEEE Trans. on CAD of Integrated Circuits and Systems, 36(1):170-183, 2017. [doi]

Possibly Related Publications

The following publications are possibly variants of this publication: