Min-Ju Chan, Chun-Lung Hsu. A Strategy for Interconnect Testing in Stacked Mesh Network-on-Chip. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 122-128, IEEE Computer Society, 2010. [doi]
Abstract is missing.