V. Chan, Ken Rim, Meikei Ieong, Sam Yang, Rajeev Malik, Young Way Teh, Min Yang, Qiqing Ouyang. Strain for CMOS performance improvement. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 667-674, IEEE, 2005. [doi]
@inproceedings{ChanRIYMTYO05,
title = {Strain for CMOS performance improvement},
author = {V. Chan and Ken Rim and Meikei Ieong and Sam Yang and Rajeev Malik and Young Way Teh and Min Yang and Qiqing Ouyang},
year = {2005},
doi = {10.1109/CICC.2005.1568758},
url = {http://dx.doi.org/10.1109/CICC.2005.1568758},
researchr = {https://researchr.org/publication/ChanRIYMTYO05},
cites = {0},
citedby = {0},
pages = {667-674},
booktitle = {Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005},
publisher = {IEEE},
isbn = {0-7803-9023-7},
}