Strain for CMOS performance improvement

V. Chan, Ken Rim, Meikei Ieong, Sam Yang, Rajeev Malik, Young Way Teh, Min Yang, Qiqing Ouyang. Strain for CMOS performance improvement. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 667-674, IEEE, 2005. [doi]

Abstract

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