Impact of voltage scaling on nanoscale SRAM reliability

Vikas Chandra, Robert C. Aitken. Impact of voltage scaling on nanoscale SRAM reliability. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 387-392, IEEE, 2009. [doi]

Authors

Vikas Chandra

This author has not been identified. Look up 'Vikas Chandra' in Google

Robert C. Aitken

This author has not been identified. Look up 'Robert C. Aitken' in Google