Vikas Chandra, Robert C. Aitken. Impact of voltage scaling on nanoscale SRAM reliability. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 387-392, IEEE, 2009. [doi]
@inproceedings{ChandraA09,
title = {Impact of voltage scaling on nanoscale SRAM reliability},
author = {Vikas Chandra and Robert C. Aitken},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090694&count=326&index=80},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/ChandraA09},
cites = {0},
citedby = {0},
pages = {387-392},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}