Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Vikas Chandra, Robert C. Aitken. Analytical model for SRAM dynamic write-ability degradation due to gate oxide breakdown. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1172-1175, IEEE, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On the impact of gate oxide degradation on SRAM dynamic and static write-abilityVikas Chandra, Robert C. Aitken. aspdac 2011: 707-712 [doi]
The following publications are possibly variants of this publication: