Extending trace history through tapered summaries in post-silicon validation - researchr publication authors

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Sandeep Chandran, Preeti Ranjan Panda, Deepak Chauhan, Sharad Kumar, Smruti R. Sarangi. Extending trace history through tapered summaries in post-silicon validation. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 737-742, IEEE, 2016. [doi]

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