Sandeep Chandran, Preeti Ranjan Panda, Deepak Chauhan, Sharad Kumar, Smruti R. Sarangi. Extending trace history through tapered summaries in post-silicon validation. In 21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016. pages 737-742, IEEE, 2016. [doi]
@inproceedings{ChandranPCKS16,
title = {Extending trace history through tapered summaries in post-silicon validation},
author = {Sandeep Chandran and Preeti Ranjan Panda and Deepak Chauhan and Sharad Kumar and Smruti R. Sarangi},
year = {2016},
doi = {10.1109/ASPDAC.2016.7428099},
url = {http://dx.doi.org/10.1109/ASPDAC.2016.7428099},
researchr = {https://researchr.org/publication/ChandranPCKS16},
cites = {0},
citedby = {0},
pages = {737-742},
booktitle = {21st Asia and South Pacific Design Automation Conference, ASP-DAC 2016, Macao, Macao, January 25-28, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9569-4},
}