Unni Chandran, Dan Zhao. Thermal Driven Test Access Routing in Hyper-interconnected Three-Dimensional System-on-Chip. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 410-418, IEEE Computer Society, 2009. [doi]
@inproceedings{ChandranZ09,
title = {Thermal Driven Test Access Routing in Hyper-interconnected Three-Dimensional System-on-Chip},
author = {Unni Chandran and Dan Zhao},
year = {2009},
doi = {10.1109/DFT.2009.42},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2009.42},
tags = {testing, routing},
researchr = {https://researchr.org/publication/ChandranZ09},
cites = {0},
citedby = {0},
pages = {410-418},
booktitle = {24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA},
editor = {Dimitris Gizopoulos and Susumu Horiguchi and Spyros Tragoudas and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}