Application of DC Transfer Characteristics in the Elimination of Redundant Vectors for Transient Noise Characterization of Static CMOS Circuits

Sreeram Chandrasekar, V. Visvanathan, Gaurav Kumar Varshney. Application of DC Transfer Characteristics in the Elimination of Redundant Vectors for Transient Noise Characterization of Static CMOS Circuits. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 336-341, IEEE Computer Society, 2005. [doi]

Abstract

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