Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test - researchr publication authors

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Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht. Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test. IEEE Trans. Industrial Informatics, 10(3):1852-1863, 2014. [doi]

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