Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht. Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test. IEEE Trans. Industrial Informatics, 10(3):1852-1863, 2014. [doi]
@article{ChangCDP14,
title = {Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test},
author = {Moon-Hwan Chang and Chaochao Chen and Diganta Das and Michael G. Pecht},
year = {2014},
doi = {10.1109/TII.2014.2332116},
url = {http://dx.doi.org/10.1109/TII.2014.2332116},
researchr = {https://researchr.org/publication/ChangCDP14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {10},
number = {3},
pages = {1852-1863},
}