Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng. Using a self-organizing neural network for wafer defect inspection. In Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: The Hague, Netherlands, 10-13 October 2004. pages 4312-4317, IEEE, 2004. [doi]
@inproceedings{ChangCJ04,
title = {Using a self-organizing neural network for wafer defect inspection},
author = {Chuan-Yu Chang and Jia-Wei Chang and MuDer Jeng},
year = {2004},
doi = {10.1109/ICSMC.2004.1401209},
url = {http://dx.doi.org/10.1109/ICSMC.2004.1401209},
researchr = {https://researchr.org/publication/ChangCJ04},
cites = {0},
citedby = {0},
pages = {4312-4317},
booktitle = {Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: The Hague, Netherlands, 10-13 October 2004},
publisher = {IEEE},
isbn = {0-7803-8566-7},
}