The following publications are possibly variants of this publication:
- An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect InspectionChuan-Yu Chang, Jia-Wei Chang, MuDer Jeng. icra 2005: 3000-3005
- An unsupervised neural network approach for automatic semiconductor wafer defect inspectionChuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng. eswa, 36(1):950-958, 2009. [doi]
- Wafer defect inspection by neural analysis of region featuresChuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng. jim, 22(6):953-964, 2011. [doi]
- Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect InspectionChuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin. ieaaie 2006: 1119-1126 [doi]