Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng. Automatic Die Inspection for Post-sawing LED Wafers. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, San Antonio, TX, USA, 11-14 October 2009. pages 1615-1620, IEEE, 2009. [doi]
Abstract is missing.