Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-Sadowska, Mike Tien-Chien Lee. Functional Scan Chain Testing. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 278, IEEE Computer Society, 1998. [doi]
Abstract is missing.