Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer. Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 358-367, IEEE Computer Society, 2001. [doi]
Abstract is missing.