Yi-Chung Chang, Shi-Yu Huang, Chao-Wen Tzeng, Jack T. Yao. A fully cell-based design for timing measurement of memory. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-10, IEEE, 2011. [doi]
Abstract is missing.