Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev. Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. IEEE Trans. VLSI Syst., 24(3):1179-1183, 2016. [doi]
@article{ChangKBKO16,
title = {Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits},
author = {Doohwang Chang and Jennifer N. Kitchen and Bertan Bakkaloglu and Sayfe Kiaei and Sule Ozev},
year = {2016},
doi = {10.1109/TVLSI.2015.2428221},
url = {http://dx.doi.org/10.1109/TVLSI.2015.2428221},
researchr = {https://researchr.org/publication/ChangKBKO16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {24},
number = {3},
pages = {1179-1183},
}