Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits

Doohwang Chang, Jennifer N. Kitchen, Bertan Bakkaloglu, Sayfe Kiaei, Sule Ozev. Design-Time Reliability Enhancement Using Hotspot Identification for RF Circuits. IEEE Trans. VLSI Syst., 24(3):1179-1183, 2016. [doi]

Abstract

Abstract is missing.