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Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization

Kevin K. Chang, Abhijith Kashyap, Hasan Hassan, Saugata Ghose, Kevin Hsieh, Donghyuk Lee, Tianshi Li, Gennady Pekhimenko, Samira Manabi Khan, Onur Mutlu. Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization. In Sara Alouf, Alain Jean-Marie, Nidhi Hegde, Alexandre Proutière, editors, Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science, Antibes Juan-Les-Pins, France, June 14-18, 2016. pages 323-336, ACM, 2016. [doi]

Authors

Kevin K. Chang

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Abhijith Kashyap

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Hasan Hassan

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Saugata Ghose

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Kevin Hsieh

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Donghyuk Lee

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Tianshi Li

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Gennady Pekhimenko

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Samira Manabi Khan

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Onur Mutlu

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