Kevin K. Chang, Abhijith Kashyap, Hasan Hassan, Saugata Ghose, Kevin Hsieh, Donghyuk Lee, Tianshi Li, Gennady Pekhimenko, Samira Manabi Khan, Onur Mutlu. Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization. In Sara Alouf, Alain Jean-Marie, Nidhi Hegde, Alexandre Proutière, editors, Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science, Antibes Juan-Les-Pins, France, June 14-18, 2016. pages 323-336, ACM, 2016. [doi]
@inproceedings{ChangKHGHLLPKM16,
title = {Understanding Latency Variation in Modern DRAM Chips: Experimental Characterization, Analysis, and Optimization},
author = {Kevin K. Chang and Abhijith Kashyap and Hasan Hassan and Saugata Ghose and Kevin Hsieh and Donghyuk Lee and Tianshi Li and Gennady Pekhimenko and Samira Manabi Khan and Onur Mutlu},
year = {2016},
doi = {10.1145/2896377.2901453},
url = {http://doi.acm.org/10.1145/2896377.2901453},
researchr = {https://researchr.org/publication/ChangKHGHLLPKM16},
cites = {0},
citedby = {0},
pages = {323-336},
booktitle = {Proceedings of the 2016 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Science, Antibes Juan-Les-Pins, France, June 14-18, 2016},
editor = {Sara Alouf and Alain Jean-Marie and Nidhi Hegde and Alexandre Proutière},
publisher = {ACM},
isbn = {978-1-4503-4266-7},
}