Ik Joon Chang, Kunhyuk Kang, Saibal Mukhopadhyay, Chris H. Kim, Kaushik Roy. Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling. In Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005. pages 439-442, IEEE, 2005. [doi]
Abstract is missing.