Daehyun Chang, Youngdae Kim, Suksoo Pyo, Shin Hun, Daesop Lee, Sohee Hwang, Jaesik Choi, Siwoong Kim. Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 87-92, IEEE, 2023. [doi]
Abstract is missing.