Albert H. Chang, Hae-Seung Lee, Duane S. Boning. Redundancy in SAR ADCs. In David Atienza, Yuan Xie, José L. Ayala, Ken S. Stevens, editors, Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, Lausanne, Switzerland, May 2-6, 2011. pages 283-288, ACM, 2011. [doi]
@inproceedings{ChangLB11,
title = {Redundancy in SAR ADCs},
author = {Albert H. Chang and Hae-Seung Lee and Duane S. Boning},
year = {2011},
doi = {10.1145/1973009.1973066},
url = {http://doi.acm.org/10.1145/1973009.1973066},
tags = {redundancy},
researchr = {https://researchr.org/publication/ChangLB11},
cites = {0},
citedby = {0},
pages = {283-288},
booktitle = {Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, Lausanne, Switzerland, May 2-6, 2011},
editor = {David Atienza and Yuan Xie and José L. Ayala and Ken S. Stevens},
publisher = {ACM},
isbn = {978-1-4503-0667-6},
}