Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng. Calibration-assisted production testing for digitally-calibrated ADCs. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 295-300, IEEE Computer Society, 2010. [doi]
@inproceedings{ChangLC10-4,
title = {Calibration-assisted production testing for digitally-calibrated ADCs},
author = {Hsiu-Ming Chang and Kuan-Yu Lin and Kwang-Ting Cheng},
year = {2010},
doi = {10.1109/VTS.2010.5469549},
url = {http://dx.doi.org/10.1109/VTS.2010.5469549},
tags = {testing},
researchr = {https://researchr.org/publication/ChangLC10-4},
cites = {0},
citedby = {0},
pages = {295-300},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}