Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting Cheng. Calibration-assisted production testing for digitally-calibrated ADCs. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 295-300, IEEE Computer Society, 2010. [doi]
Abstract is missing.