The following publications are possibly variants of this publication:
- Calibration and Testing Time Reduction Techniques for a Digitally-Calibrated Pipelined ADCHsiu-Ming Chang, Chin-Hsuan Chen, Kuan-Yu Lin, Kwang-Ting Cheng. vts 2009: 291-296 [doi]
- Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case StudyHsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng. et, 26(1):59-71, 2010. [doi]
- Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCsHsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng. tcas, 58-I(12):2838-2848, 2011. [doi]
- A self-testing and calibration method for embedded successive approximation register ADCXuan-Lun Huang, Ping-Ying Kang, Hsiu-Ming Chang, Jiun-Lang Huang, Yung-Fa Chou, Yung-Pin Lee, Ding-Ming Kwai, Cheng-Wen Wu. aspdac 2011: 713-718 [doi]