Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs

Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng. Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. on Circuits and Systems, 58-I(12):2838-2848, 2011. [doi]

Abstract

Abstract is missing.