Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng. Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. on Circuits and Systems, 58-I(12):2838-2848, 2011. [doi]
@article{ChangLC11-5,
title = {Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs},
author = {Hsiu-Ming Chang and Kuan-Yu Lin and Kwang-Ting (Tim) Cheng},
year = {2011},
doi = {10.1109/TCSI.2011.2158706},
url = {http://dx.doi.org/10.1109/TCSI.2011.2158706},
researchr = {https://researchr.org/publication/ChangLC11-5},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {58-I},
number = {12},
pages = {2838-2848},
}