Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs

Hsiu-Ming Chang, Kuan-Yu Lin, Kwang-Ting (Tim) Cheng. Tester-Assisted Calibration and Screening for Digitally-Calibrated ADCs. IEEE Trans. on Circuits and Systems, 58-I(12):2838-2848, 2011. [doi]

Authors

Hsiu-Ming Chang

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Kuan-Yu Lin

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Kwang-Ting (Tim) Cheng

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