Yuhe Chang, William S. Nagel, Kam K. Leang, Sean B. Andersson. Comparison of Two Optimization-Based Controllers for Feature Tracking SPM Scanning in Dual-Stage Nanopositioners. In 2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021. pages 4315-4320, IEEE, 2021. [doi]
@inproceedings{ChangNLA21,
title = {Comparison of Two Optimization-Based Controllers for Feature Tracking SPM Scanning in Dual-Stage Nanopositioners},
author = {Yuhe Chang and William S. Nagel and Kam K. Leang and Sean B. Andersson},
year = {2021},
doi = {10.23919/ACC50511.2021.9483306},
url = {https://doi.org/10.23919/ACC50511.2021.9483306},
researchr = {https://researchr.org/publication/ChangNLA21},
cites = {0},
citedby = {0},
pages = {4315-4320},
booktitle = {2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4197-1},
}